Method and apparatus for increasing yield
US8553442B2 · kind B2 · utility
2Cited by
0References
25Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 28, 2010 |
| Grant date | Oct 8, 2013 |
| Priority date | — |
| Expiry date | Jul 21, 2031 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02D10/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Aspects of the disclosure provide an integrated circuit (IC) that is configured to have an increased yield. The IC includes a memory element configured to store a specific value determined based on a characteristic of the IC, and a controller configured to control an input regulator based on the specific value of the IC. The input regulator is operative to provide a regulated input to the IC during operation, such that the IC performance satisfies performance requirement.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.