Patent · US Active

Method for calibrating a thickness gauge

US8554503B2 · kind B2 · utility

2Cited by

4References

15Claims

0Family size

Assignee

MICRO-EPSILON-MESSTECHNIK GMBH & CO. KG · DE

Inventors

Günter Schallmoser · Ruhstorf, DE
Karl Wisspeintner · Ortenburg, DE
Robert Wagner · Neuburg am Inn, DE

Key dates

Filing date	Apr 21, 2009
Grant date	Oct 8, 2013
Priority date	—
Expiry date	Apr 16, 2030

Classification

Technology area (CPC G)Physics
CPC primaryG01B2210/44
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A method for calibration of a thickness gauge is provided in which the thickness gauge measures the thickness of a measured object in a stipulated measurement direction with at least one displacement sensor, operating contactless or by scanning, a reference object with known thickness and shape being brought into at least one partial area of the measurement field of the at least one displacement sensor.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.