Testing of analog-to-digital converters
US8558726B2 · kind B2 · utility
1Cited by
4References
17Claims
0Family size
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Key dates
| Filing date | Dec 29, 2011 |
| Grant date | Oct 15, 2013 |
| Priority date | — |
| Expiry date | Dec 29, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/46
- WIPO fieldBasic communication processes
- WIPO sectorElectrical engineering
Abstract
Complete testing of an analog-to-digital converter (ADC) can be carried out using digital signals and at high speeds. Circuit elements are added to an ADC so that a first phase of testing may be carried out using a limited number of analog test voltages. The ADC may then be reconfigured using added circuit elements to disable conventional analog-to-digital conversion. A digital signal may then be applied to the ADC to rapidly test all switching elements used in analog-to-digital conversion. According to some implementations, testing times for ADCs may be reduced from hours to milliseconds.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.