Learning expected values for facts
US8560468B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 10, 2011 |
| Grant date | Oct 15, 2013 |
| Priority date | — |
| Expiry date | Feb 9, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06N5/02
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, systems, and apparatus, including computer programs encoded on a computer storage medium, for machine learning. In one aspect, a method includes receiving a collection of facts, each fact represented as an entity-attribute-value tuple; identifying expected values for one or more individual attributes, where the identifying expected values includes, for each particular attribute: identifying facts having the attribute, calculating a value score for facts of the collection of facts having the particular attribute for each particular value, calculating a global score for all facts of the collection having the attribute, and comparing the value score to the global score such that a value is identified as an expected value if the comparison satisfies a specified threshold.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.