Connection device for quality testing of charge-coupled device modules
US8564320B2 · kind B2 · utility
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9Claims
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Key dates
| Filing date | May 26, 2011 |
| Grant date | Oct 22, 2013 |
| Priority date | — |
| Expiry date | Jan 17, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/002
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A connection device for connecting charge-coupled device (CCD) modules to test apparatuses to test the CCD modules includes a connection unit and a test unit. The connection unit includes a plurality of connection pins. The unit under test is electrically connected to the connection unit and the test apparatuses. When the connection pins are in contact with the CCD modules, the CCD modules are electrically connected to the test apparatuses through the connection unit and the test unit, such that the test apparatus receives electric signals generated by the CCD modules to enable quality testing of the CCD modules.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.