Method for de-embedding device measurements
US8566058B2 · kind B2 · utility
129Cited by
3References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Apr 6, 2009 |
| Grant date | Oct 22, 2013 |
| Priority date | — |
| Expiry date | May 27, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R27/32
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method is provided for de-embedding measurements from a given network containing mixtures of devices with known and unknown S-parameters given a description of the network and the known S-parameters of the overall system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.