Automated testing on devices
US8566648B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | May 10, 2011 |
| Grant date | Oct 22, 2013 |
| Priority date | — |
| Expiry date | Mar 20, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/3672
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Disclosed herein are techniques for testing a device. In some implementations, a request to perform a test instruction on one or more of a plurality of computing devices is received at a server. The test instruction may be configured to test an application or capability associated with the one or more computing devices. The test instruction may be written in accordance with a computer programming language capable of being translated into a plurality of different programming language instructions sets. A first computing device may be selected from the plurality of computing devices. The first computing device may be capable of performing instructions written in a first one of the computer programming language instruction sets. The test instruction may be transmitted to the first computing device via the network. A response message may be received from the first computing device.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.