System and method for determining ionization susceptibility using x-rays
US8571175B2 · kind B2 · utility
2Cited by
3References
20Claims
0Family size
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Key dates
| Filing date | Nov 30, 2009 |
| Grant date | Oct 29, 2013 |
| Priority date | — |
| Expiry date | Dec 10, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/221
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system for determining ionization susceptibility including a sample, an x-ray generator configured to generate a pulsed x-ray beam, and focusing optics disposed between the sample and the x-ray generator, the focusing optics being configured to focus the pulsed x-ray beam into a spot on the sample.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.