Method of determining parameter from sparse measurement data
US8571842B2 · kind B2 · utility
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8Claims
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Key dates
| Filing date | Jun 21, 2010 |
| Grant date | Oct 29, 2013 |
| Priority date | — |
| Expiry date | Dec 7, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V2210/169
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of simultaneously determining multiple parameters or a parameter distribution characterizing material properties of a volume under investigation using an inversion process of sparse measurements is described including the step of defining an initial model of the volume and modifying the initial model by matching the multiple parameters or parameter distribution with the measurements using alternatingly an iterative inversion method and a probabilistic inversion method, and determining the multiple parameters or parameter distribution after one or more iterations of the alternating inversions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.