System and method for managing information stored in semiconductors
US8572440B1 · kind B1 · utility
9Cited by
2References
49Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Nov 15, 2010 |
| Grant date | Oct 29, 2013 |
| Priority date | — |
| Expiry date | Oct 7, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F2212/1052
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system and method of identifying a memory includes detecting defects in regions of the memory, comparing the detected defects with defects contained in a previously-created defect map associated with the memory and stored in another memory of a device accessing the memory, confirming the identity of the memory where a result of the comparison indicates the detected defects match defects contained in the previously-created defect map; and denying the identity of the memory where the result of the comparison indicates the detected defects do not match the defects contained in the previously-created defect map.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.