Semiconductor device, electronic device, and method of testing the semiconductor device
US8575978B2 · kind B2 · utility
7Cited by
3References
8Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | May 2, 2012 |
| Grant date | Nov 5, 2013 |
| Priority date | — |
| Expiry date | May 2, 2032 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03K19/00361
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A coupling failure of a supply terminal or a ground terminal is easily detected. A diode is disposed between a supply terminal of a semiconductor device and a first I/O terminal so that the supply terminal is located on a cathode side, and the first I/O terminal is located on an anode side. A determination unit determines whether or not a voltage of the supply terminal is lower than a voltage of the first I/O terminal when a signal of high level equal to a supply voltage is input to the first I/O terminal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.