System and method for adaptive overlap and add length estimation
US8576961B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 15, 2009 |
| Grant date | Nov 5, 2013 |
| Priority date | — |
| Expiry date | Mar 30, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04L25/0224
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A method for determining an overlap and add length estimate comprises determining a plurality of correlation values of a plurality of ordered frequency domain samples obtained from a data frame; comparing the correlation values of a first subset of the samples to a first predetermined threshold to determine a first edge sample; comparing the correlation values of a second subset of the samples to a second predetermined threshold to determine a second edge sample; using the first and second edge samples to determine an overlap and add length estimate; and providing the overlap and add length estimate to an overlap and add circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.