Patent · US Active

X-ray detector for phase contrast imaging

US8576983B2 · kind B2 · utility

31Cited by

3References

22Claims

0Family size

Assignee

KONINIKLIJKE PHILIPS N.V. · NL

Inventors

Christian Baeumer · Hergenrath, BE
Klaus Juergen Engel · Aachen, DE
Christoph Herrmann · Aachen, DE

Key dates

Filing date	Feb 9, 2009
Grant date	Nov 5, 2013
Priority date	—
Expiry date	Sep 5, 2029

Classification

Technology area (CPC G)Physics
CPC primaryG21K2207/005
WIPO fieldEngines, pumps, turbines
WIPO sectorMechanical engineering

Abstract

The invention relates to an X-ray detector (30) that comprises an array of sensitive elements (Pi−1,b, Pia, Pib, Pi+1,a, Pi+1,b) and at least two analyzer gratings (G2a, G2b) disposed with different phase and/or periodicity in front of two different sensitive elements. Preferably, the sensitive elements are organized in macro-pixels (IIi) of e.g. four adjacent sensitive elements, where analyzer gratings with mutually different phases are disposed in front said sensitive elements. The detector (30) can particularly be applied in an X-ray device (100) for generating phase contrast images because it allows to sample an intensity pattern (I) generated by such a device simultaneously at different positions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.