Method of determining the particle sensitivity of electronic components
US8577662B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Oct 23, 2008 |
| Grant date | Nov 5, 2013 |
| Priority date | — |
| Expiry date | Aug 22, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/308
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
To analyze an electronic component, this component is exposed to a focused laser beam. The information provided by the laser mapping relating to the position and to the depth of the sensitivity zones of the component is used as input parameter in prediction codes for quantifying the sensitivity of the mapped component to ionizing particles in the natural radioactive environment. The prediction codes are used to determine the occurrence of malfunctions in the electronic component. Determination of the risks associated with the radiative environment imposes two aspects: one, probabilistic, takes into account the particle/matter interaction and the other, electrical, takes into account the charge collection inside the electronic component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.