Patent · US Active

Inspection pin protection structure of conduction check apparatus

US8581599B2 · kind B2 · utility

0Cited by
8References
10Claims
0Family size

Assignee

Inventor

Key dates

Filing dateDec 26, 2008
Grant dateNov 12, 2013
Priority date
Expiry dateJun 21, 2030

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01R2201/20
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A conduction check apparatus including an inspection part (4) having a main body (22) having a surface (23a), inspection pins (21) protruded from the surface (23a), a guide pin (8) provided on the surface (23a); and a protection board 6 sliding along the guide pin (8) from a first position to a second position and having a plurality of holes (28). At the first position, the protection board (6) covers a tip of each of the inspection pins (21) and, at the second position, each of the inspection pins (21) jut out from the respective one of the holes (28). The conduction check apparatus includes a connector setting part (3) relatively moving toward the inspection part (4). The protection board (6) moves between the first and the second position during the relative movement.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.