Infrared defect detection system and method for the evaluation of powdermetallic compacts
US8581975B2 · kind B2 · utility
1Cited by
17References
20Claims
0Family size
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Key dates
| Filing date | Jun 18, 2007 |
| Grant date | Nov 12, 2013 |
| Priority date | — |
| Expiry date | Dec 1, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/30164
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A pulsed thermography defect detection apparatus including active and passive infrared (IR) thermography for non-destructive testing (NDT) of powdermetallic (P/M) components for on-line and off-line inspection.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.