Active matrix substrate with connections of switching elements and inspecting wirings, display device, method for inspecting active matrix substrate, and method for inspecting display device
US8582068B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Apr 28, 2009 |
| Grant date | Nov 12, 2013 |
| Priority date | — |
| Expiry date | Mar 2, 2030 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH10K59/131
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
An active matrix substrate is provided with first inspection wirings (70, 75) capable of inputting inspection signals to first switching wirings that are not adjacent to each other among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other among the second switching wirings (69, 74), and second inspection wirings (72, 77) capable of inputting inspection signals to first switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the first switching wirings (69, 74) and to second switching wirings that are not adjacent to each other and not connected to the first inspection wirings among the second switching wirings (69, 74).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.