Automatic optical measurement system and method
US8582106B2 · kind B2 · utility
2Cited by
30References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 4, 2008 |
| Grant date | Nov 12, 2013 |
| Priority date | — |
| Expiry date | Jun 26, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2201/0256
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An automatic optical measurement system (100) is provided. The measurement system (100) includes a sample vial (10) and an automatic optical measurement apparatus (90) configured to receive the sample vial (10). The automatic optical measurement apparatus (90) is configured to detect a presence of the sample vial (10) in the automatic optical measurement apparatus (90) and measure a light intensity of light substantially passing through the sample vial (10) if the sample vial (10) is present. The measured light intensity is related to sample material properties of a sample material within the sample vial (10).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.