Dual-energy material identification method and apparatus with undersampling
US8582857B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Dec 30, 2009 |
| Grant date | Nov 12, 2013 |
| Priority date | — |
| Expiry date | Mar 20, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2211/408
- WIPO fieldMedical technology
- WIPO sectorInstruments
Abstract
A dual-energy material identification method and system with under-sampling is disclosed. A CT image of the object is obtained by using the CT image reconstruction method, while the dual-energy projections are under-sampled to obtain a few samples. Photoelectric coefficient integral and Compton coefficient integral are computed from these dual-energy projection data. The CT image is segmented into regions with image processing technique, and the regions are labeled. The length by which a few dual-energy rays crosses each labeled region is computed, and an equation system is established with dual-energy preprocessing dual-effect decomposition reconstruction method to compute Photoelectric coefficient and Compton coefficient, and then atomic number and electron density of material in each region are computed. The material of the object can be identified with the atomic number.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.