Imaging systems, imaging device analysis systems, imaging device analysis methods, and light beam emission methods
US8587849B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 27, 2005 |
| Grant date | Nov 19, 2013 |
| Priority date | — |
| Expiry date | Dec 19, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N17/02
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Imaging systems, imaging device analysis systems, imaging device analysis methods, and light beam emission methods are described. According to one aspect, an imaging device analysis method includes receiving initial light comprising a plurality of wavelengths of light, filtering some of the wavelengths of the initial light forming a plurality of light beams comprising different wavelengths of light, after the filtering, optically communicating the light beams of the different wavelengths of light to an imaging device, receiving the light beams using the imaging device, and analyzing the imaging device using light, wherein the light beams comprising the different wavelengths of light are emitted beams after the receiving.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.