Generation of a hologram pattern
US8587852B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Aug 3, 2004 |
| Grant date | Nov 19, 2013 |
| Priority date | — |
| Expiry date | Sep 11, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG03H2226/04
- WIPO fieldOptics
- WIPO sectorInstruments
Abstract
Device for generating a hologram pattern including: selecting means for selecting, as cross section ranges which are in a plurality of cross sections parallel to hologram pattern in 3D object and which are ranges used for generating hologram pattern, cross section ranges which overlap ranges in other cross sections when the relevant cross section is perspectively seen from a predetermined observation point on the hologram pattern; depth integrating means for calculating, for lattice points in one cross section range, a depth integral function acquired by integrating an inverse diffraction function for determining hologram pattern for displaying points of 3D object with respect to respective lattice points in the cross section ranges which overlap the relevant lattice point; and inverse Fourier transform means for generating hologram pattern by performing two-dimensional inverse transform on depth integral functions with respect to plurality of lattice points in one cross section range.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.