Superpixel-boosted top-down image recognition methods and systems
US8588518B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Nov 22, 2010 |
| Grant date | Nov 19, 2013 |
| Priority date | — |
| Expiry date | Oct 28, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20076
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Systems and methods for implementing a superpixel boosted top-down image recognition framework are provided. The framework utilizes superpixels comprising contiguous pixel regions sharing similar characteristics. Feature extraction methods described herein provide non-redundant image feature vectors for classification model building. The provided framework differentiates a digitized image into a plurality of superpixels. The digitized image is characterized through image feature extraction methods based on the plurality of superpixels. Image classification models are generated from the extracted image features and ground truth labels and may then be used to classify other digitized images.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.