Patent · US Active

Methods and apparatus for providing a built-in self test

US8589750B2 · kind B2 · utility

6Cited by

3References

33Claims

0Family size

Assignee

QUALCOMM Incorporated · US

Inventors

Gaurab Banerjee · Survanagiri, IN
Manas Behera · Cedar Park, US
Kenneth Charles Barnett · Austin, US

Key dates

Filing date	Jul 14, 2010
Grant date	Nov 19, 2013
Priority date	—
Expiry date	Apr 10, 2031

Classification

Technology area (CPC G)Physics
CPC primaryG06F11/27
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A built-in self test (BiST) system is described. The BiST system includes a circuit-under-test. The BiST system also includes one or more embedded sensors. Each of the embedded sensors includes one or more switches connected to one or more nodes within the circuit-under-test. The BiST system further includes a signal generator. The BiST system also includes a bus interface. The bus interface provides for external access of the BiST system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.