Thin film wafer level package
US8592998B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Jan 24, 2011 |
| Grant date | Nov 26, 2013 |
| Priority date | — |
| Expiry date | Jan 24, 2031 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB81C2203/0735
- WIPO fieldMicro-structural and nano-technology
- WIPO sectorChemistry
Abstract
Anchor designs for thin film packages are disclosed that, in a preferred embodiment are a combination of SiGe-filled trenches and Si-oxide-filled spacing. Depending on the release process, additional manufacturing process steps are performed in order to obtain a desired mechanical strength. For aggressive release processes, additional soft sputter etch and a Ti—TiN interlayer in the anchor region may be added. The ratio of the total SiGe—SiGe anchor area to the SiO2—SiGe anchor area determines the mechanical strength of the anchor. If this ratio is larger than 1, the thin film package reaches the MIL-standard requirements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.