Method of locating features of an object
US8594430B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Apr 5, 2007 |
| Grant date | Nov 26, 2013 |
| Priority date | — |
| Expiry date | Jul 28, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/7557
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method of locating features of an object, of a class of objects, of a class of objects, within a target image. The method comprises initializing a set of feature points within the target image, each feature point corresponding to a predetermined feature for objects of the class of objects; deriving a set of template detectors, from the set of feature points, using a statistical model of the class of objects, each template detector comprising an area of image located about the location of a feature point for an object of the class of objects; comparing the set of template detectors with the target image; and updating the set of feature points within the target image in response to the result of the comparison.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.