Method for compensating a measured value offset
US8594964B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | May 26, 2011 |
| Grant date | Nov 26, 2013 |
| Priority date | — |
| Expiry date | Feb 20, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01C17/38
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a method for determining an offset of measured values of a multiaxial directional sensor using a superposed signal, a large number of multiaxial measured values are recorded first. Measured values, which are recorded in different orientations of the directional sensor, form a geometric figure in a coordinate system resulting from the measuring axes of the sensor, the ideal form of the geometric figure being known and the ideal center point of which being located at the origin of the measuring axes. In the case of a biaxial sensor, the geometric figure is a circle; in the case of a triaxial sensor, it is a sphere around the origin. The superposition caused by the interference is reflected in that the center point of the geometric figure is shifted in relation to the origin of the measuring axes. The offset is measured by determining this shift.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.