Reduced-pain allergy skin test device

US8597199B2 · kind B2 · utility

Inventors

• Ziv Harish · Tenafly, US
• Isaac Rubinstein · Haworth, US
• Ehud Arbit · Englewood, US
• Russ Weinzimmer · Milford, US

Key dates

• Filing date: Oct 11, 2010
• Grant date: Dec 3, 2013
• Expiry date: Jun 5, 2031

Classification

• Technology area (CPC A): Human Necessities
• CPC primary: A61B10/0035
• WIPO field: Medical technology
• WIPO sector: Instruments

Abstract

An allergy skin test device is disclosed that causes less pain than commonly used devices that include multi-point sharp puncture heads. The allergy skin test device incorporates multiple dull pressure heads distributed amongst the sharp multi-point sharp puncture heads, each dull pressure head activating a neurological pain gate that reduces pain sensation typically caused by the neighboring multi-point head when it engages the skin.