Testing of high-speed input-output devices
US8598898B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Oct 5, 2010 |
| Grant date | Dec 3, 2013 |
| Priority date | — |
| Expiry date | Feb 20, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31716
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Embodiments of the invention are generally directed to testing of high-speed input-output devices. An embodiment of a high-speed input-output apparatus includes a transmitter and a receiver, and a loop-back connection from an output of the transmitter to an input of the receiver, the loop-back connection including a first connector and a second connector for transmission of differential signals. The apparatus further includes a first inductor having a first terminal and a second terminal and second inductor having a first terminal and a second terminal, the first terminal of the first inductor being connected to the first connector and the first terminal of the second inductor being connected to the second connector, the second terminal of the first inductor and the second terminal of the second inductor providing a test access port for direct current testing of the apparatus.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.