Method and system for electronic inspection of baggage and cargo
US8600149B2 · kind B2 · utility
40Cited by
4References
22Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 25, 2008 |
| Grant date | Dec 3, 2013 |
| Priority date | — |
| Expiry date | Jan 1, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N23/04
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method and system of electronically inspecting baggage comprises generating scan data representative of a piece of baggage. At least one of a contour and a surface is extracted from the scan data, and the at least one of a contour and a surface is representative of an object within the baggage. An object database comprises data representative of shapes of known objects, and the at least one of a contour and surface is compared to the object database to identify an object match which is presented.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.