Optical mark classification system and method
US8600165B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Feb 12, 2010 |
| Grant date | Dec 3, 2013 |
| Priority date | — |
| Expiry date | Feb 26, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V30/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A system, method, and apparatus for mark recognition in an image of an original document are provided. The method/system takes as input an image of an original document in which at least one designated field is provided for accepting a mark applied by a user (which may or may not have been marked). A region of interest (RoI) is extracted from the image, roughly corresponding to the designated field. A center of gravity (CoG) of the RoI is determined, based on a distribution of black pixels in the RoI. Thereafter, for one or more iterations, the RoI is partitioned into sub-RoIs, based on the determined CoG, where at a subsequent iteration, sub-RoIs generated at the prior iteration serve as the RoI partitioned. Data is extracted from the RoI and sub-RoIs at one or more of the iterations, which allows a representation of the entire RoI to be generated which is useful in classifying the designated field, e.g., as positive (marked) or negative (not marked).
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.