Simultaneous sensitivity testing for multiple devices in radio-frequency test systems
US8600311B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Mar 10, 2011 |
| Grant date | Dec 3, 2013 |
| Priority date | — |
| Expiry date | Nov 2, 2031 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04W52/143
- WIPO fieldTelecommunications
- WIPO sectorElectrical engineering
Abstract
A test station may include a test host, a signal generator, and a test chamber. Multiple devices under test (DUTs) may be placed in the test chamber during device characterization operations. Radio-frequency signals may be conveyed from the signal generator to the multiple DUTs using a radiated arrangement through an antenna in the test chamber. The signal generator may broadcast downlink test signals. The DUTs may synchronize with the downlink test signals and measure radio-frequency performance levels while receiving the downlink test signals. The test host may direct the signal generator to gradually lower its output power level. The DUTs may be used to determine downlink sensitivity by monitoring the measured radio-frequency performance levels as the output power level of the signal generator is lowered. Downlink sensitivity testing may be performed across any desired radio-frequency bands and channels.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.