Patent · US Active

Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life

US8600685B2 · kind B2 · utility

19Cited by
18References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 23, 2011
Grant dateDec 3, 2013
Priority date
Expiry dateDec 23, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2834
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Disclosed are systems and methods for prognostic health management (PHM) of electronic systems. Such systems and methods present challenges traditionally viewed as either insurmountable or otherwise not worth the cost of pursuit. The systems and methods are directed to the health monitoring and failure prediction of electronic systems, including the diagnostic methods employed to assess current health state and prognostic methods for the prediction of electronic system failures and remaining useful life. The disclosed methodologies include three techniques: (1) use of existing electronic systems data (circuit as a sensor); (2) use of available external measurements as condition indicators and degradation assessor; and (3) performance assessment metrics derived from available external measurements.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.