Test access component for automatic testing of circuit assemblies
US8604820B2 · kind B2 · utility
Assignee
Inventor
Key dates
| Filing date | Feb 18, 2010 |
| Grant date | Dec 10, 2013 |
| Priority date | — |
| Expiry date | Jan 1, 2032 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY02P70/50
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A reliable and durable method of testing of printed circuit boards is presented. Test access components are placed in contact regions for providing electrical connectivity between test probes and the printed circuit board. In some cases, a test access component may be a surface mount resistor. The test access component may provide two points of contact for test probes to make electrical and mechanical contact with the printed circuit board. Test access components may also provide for increased durability of testing, allowing for a greater number of test contacts to be made between test probes and printed circuit boards than were previously possible.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.