Critical-angle refractometery
US8605271B2 · kind B2 · utility
1Cited by
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12Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 25, 2011 |
| Grant date | Dec 10, 2013 |
| Priority date | — |
| Expiry date | Nov 8, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/43
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A critical-angle refractometer which utilizes an in image of light reflected from an optical interface with a vessel containing a sample under test to determine an optical property of the sample, sample properties are evaluated to prevent improper testing of the sample. This evaluation includes establishing reflectance information associating the amount of reflection with locations in the image; and utilizing a plurality of properties of the reflectance information to determine if the vessel contains a proper sample under test.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.