Methods, devices and systems for characterizing polarities of piezoelectric (PZT) elements of a two PZT element microactuator
US8605383B1 · kind B1 · utility
23Cited by
37References
20Claims
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Key dates
| Filing date | May 21, 2012 |
| Grant date | Dec 10, 2013 |
| Priority date | — |
| Expiry date | Jun 12, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2829
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for characterizing polarities of piezoelectric (PZT) elements of a two-element PZT microactuator mechanically coupled to a structure may include calculating an impedance of the two PZT element microactuator over a predetermined frequency range; summing the calculated impedance over the predetermined frequency range; and characterizing the polarities of the PZT elements of the two PZT element microactuator as being different if the summed impedance is greater than a threshold value and as being the same if the summed impedance is less than or equal to the threshold value.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.