Management of test artifacts using cascading snapshot mechanism
US8607152B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jun 11, 2009 |
| Grant date | Dec 10, 2013 |
| Priority date | — |
| Expiry date | Feb 28, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F9/451
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Described is a method for managing test artifacts. According to an embodiment of the method, a test plan for a product is selected by a user. The test plan has multiple test artifacts that include the test plan and at least one of a test case, an execution record defining a configuration of the product, and a product requirement. One of the test artifacts is selected for a snapshot and the snapshot is acquired. The snapshot acquisition includes storing a current state of the selected test artifact, storing a current state of relationships of the selected test artifact to the other test artifacts, and storing a current state of the other test artifacts that have a relationship with the selected test artifact.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.