Systems and methods for detecting capacitor process variation
US8610442B2 · kind B2 · utility
4Cited by
13References
27Claims
0Family size
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Key dates
| Filing date | Apr 6, 2009 |
| Grant date | Dec 17, 2013 |
| Priority date | — |
| Expiry date | Jul 4, 2029 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2837
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method for detecting capacitor variation in a device comprises operating an oscillator in the device, the oscillator being an Inductive-Capacitive (LC) oscillator and including an inductor of known value and a capacitor under test, comparing an output of the oscillator to a reference output, and evaluating variation for a plurality of capacitors in the device based on the comparing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.