Patent · US Active

Characterization of an entangled photon system

US8611535B2 · kind B2 · utility

19Cited by
19References
18Claims
0Family size

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Inventors

Key dates

Filing dateSep 15, 2010
Grant dateDec 17, 2013
Priority date
Expiry dateSep 30, 2032

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY04S40/20
  • WIPO fieldTelecommunications
  • WIPO sectorElectrical engineering

Abstract

A quantum key distribution system comprises a source of entangled photon pairs and two single-photon detectors. The source is coupled to each of the single-photon detectors by optical fiber. Operational systems parameters include the efficiency of the first single-photon detector, the efficiency of the second single-photon detector, and the maximum average number of photon pairs per unit time generated by the source. To characterize the operational systems parameters, the transmittances between the source and each single-photon detector are determined. The dark count probability of the first single-photon detector and the dark count probability of the second single-photon detector are determined. The count probability at the first single-photon detector, the count probability at the second single-photon detector, and the coincidence count probability are determined as a function of the optical power from the source. By fitting the values to a set of relationships, the operational systems parameters are computed.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.