Landmark identification using metadata
US8611592B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Aug 25, 2010 |
| Grant date | Dec 17, 2013 |
| Priority date | — |
| Expiry date | May 5, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V2201/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Methods, systems, and apparatus are presented for associating a point of interest with a captured image. In one aspect, metadata associated with a digital image can be accessed, the metadata identifying an image capture location. Further, a depth of field corresponding to the digital image can be determined and one or more points of interest can be identified that are located within the determined depth of field. Additionally, one of the one or more identified points of interest can be selected as an image subject and the metadata associated with the digital image can be edited to include data identifying the selected point of interest.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.