System and method for invariant-based normal estimation
US8611674B1 · kind B1 · utility
Assignee
Inventors
Key dates
| Filing date | Jan 18, 2010 |
| Grant date | Dec 17, 2013 |
| Priority date | — |
| Expiry date | Sep 17, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/60
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A computer-implemented method for invariant-based normal estimation. The method includes calculating a set of measured invariants for a point associated with a surface of an object, where the set of measured invariants is based on pixel information that includes lighting information, calculating one or more sets of estimated invariants for the point associated with the surface of the object, where each set of estimated invariants is based on a known lighting environment for the object and a different normal for the point associated with the surface of the object, and determining a first normal for the point associated with the surface of the object that results in the set of measured invariants corresponding to a first set of estimated invariants.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.