Memory error detection circuitry

US8612814B1 · kind B1 · utility

Assignee

• Altera Corporation · US

Inventors

• Jun Tan · Kepong, MY
• Kiun Kiet Jong · Merang, MY
• Boon Jin Ang · Butterworth, MY

Key dates

• Filing date: Jun 14, 2010
• Grant date: Dec 17, 2013
• Expiry date: Apr 25, 2031

Classification

• Technology area (CPC G): Physics
• CPC primary: G11C2029/0409
• WIPO field: Computer technology
• WIPO sector: Electrical engineering

Abstract

Integrated circuits with error detection circuitry are provided. Integrated circuits may include memory cells organized into frames. The error detection circuitry may compress each frame to scan for soft errors. The error detection circuitry may include multiple input shift registers (MISRs), a data register, and a signature comparator. The data frames may be read, compressed, and shifted into the MISRs in parallel. After all the data frames have been read, the MISRs may provide a scanned MISR signature at their outputs. Computer-aided design (CAD) tools may be used to calculate a precomputed MISR signature. The precomputed MISR signature may be loaded into the data register. The signature comparator compares the scanned MISR signature with the precomputed MISR signature. If the signatures match, then the device is free of soft errors. If the signatures do not match, then at least one soft error exists.