Patent · US Active

Marking method for the reject marking of test elements

US8618511B2 · kind B2 · utility

1Cited by

7References

26Claims

0Family size

Assignee

Roche Diagnostics Operations, Inc. · US

Inventors

Josef K. Roper · Schifferstadt, DE
Werner Finke · Lorsch, DE
Martin Frank · Hofheim, DE
Gunter Schmidt · Lampertheim, DE
Siegfried Dick · Mannheim, DE
Peter Stubenbord · Schifferstadt, DE

Key dates

Filing date	Sep 18, 2008
Grant date	Dec 31, 2013
Priority date	—
Expiry date	Aug 30, 2029

Classification

Technology area (CPC Y)Emerging Cross-Sectional Technologies
CPC primaryY10T29/53022
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The test elements are provided that are adapted to detect at least one analyte in a sample. At least some of the test elements are provided with a defect marking which contains information about defectiveness of the test elements. The test elements include at least one radiation-sensitive material. The test elements are exposed to at least one radiation, the radiation being adapted to induce marking in the form of at least one optically detectable change in the radiation-sensitive material.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.