Patent · US Active

Terahertz scanning reflectometer

US8620132B2 · kind B2 · utility

4Cited by

13References

16Claims

0Family size

Inventors

Anis Rahman · Irvine, US
Aunik K. Rahman · Hummelstown, US

Key dates

Filing date	Mar 16, 2012
Grant date	Dec 31, 2013
Priority date	—
Expiry date	Jul 6, 2032

Classification

Technology area (CPC G)Physics
CPC primaryG02F2203/13
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A terahertz scanning reflectometer is described herein. A high sensitivity terahertz scanning reflectometer is used to measure dynamic surface deformation and delamination characteristics in real-time. A number of crucial parameters can be extracted from the reflectance measurements such as dynamic deformation, propagation velocity, and final relaxation position. A terahertz reflectometer and spectrometer are used to determine the permeation kinetics and concentration profile of active ingredients in stratum corneum.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.