Determining patent infringement risk exposure using litigation analysis

US8620800B1 · kind B1 · utility

Assignee

• IVP Holdings III LLC · US

Inventors

• Fadi Victor Micaelian · Menlo Park, US
• Matt Huey · Santa Clara, US
• Richard L. Schank · Pittsford, US
• Sanjay Prasad · Rockville, US
• Gregory D. Gorder · Seattle, US

Key dates

• Filing date: Sep 12, 2011
• Grant date: Dec 31, 2013
• Expiry date: Oct 31, 2031

Classification

• Technology area (CPC G): Physics
• CPC primary: G06Q50/184
• WIPO field: IT methods for management
• WIPO sector: Electrical engineering

Abstract

Methods, systems, and techniques for estimating patent infringement risk for a company using a statistical model of revenue are provided. Examples also provide a Patent Infringement Risk Assessment Tool, which uses these techniques to enable users to dynamically modify certain parameters and obtain a feel for their affect upon patent infringement risk exposure. Other examples describe the applicability of some of the methods and techniques for describing models of overall behavior when only the behavior of a segment at either the low end or high end (a tail) is known.