Patent · US Active

Precision measurement of waveforms

US8620976B2 · kind B2 · utility

4Cited by
8References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 11, 2011
Grant dateDec 31, 2013
Priority date
Expiry dateSep 23, 2031

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06F17/141
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A machine-implemented method for computerized digital signal processing including obtaining a digital signal from data storage or from conversion of an analog signal, and determining, from the digital signal, one or more measuring matrices. Each measuring matrix has a plurality of cells, and each cell has an amplitude corresponding to the signal energy in a frequency bin for a time slice. Cells in each measuring matrix having maximum amplitudes along a time slice and/or frequency bin are identified as maximum cells. Maxima that coincide in time and frequency are identified and a correlated maxima matrix, called a “Precision Measuring Matrix” is constructed showing the coinciding maxima and the adjacent marked maxima are linked into partial chains.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.