Self identifying template gage probing system
US8621761B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Dec 30, 2011 |
| Grant date | Jan 7, 2014 |
| Priority date | — |
| Expiry date | Jul 20, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B3/14
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A component inspection system comprises a sensor apparatus and a template having a component side and an opposing inspection side. The inspection side includes a plurality of inspection bosses projecting therefrom, each of the plurality of inspection bosses having a first coupling and a sensor aperture. Each aperture is disposed axially through each respective boss to the component side of the template. The sensor apparatus includes a receptacle for retaining a sensor. The receptacle has a second coupling configured to individually engage with each of the plurality of first couplings for removably securing the sensor apparatus to a respective at least one of the plurality of inspection bosses.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.