Method for optically scanning and measuring an object
US8625106B2 · kind B2 · utility
Assignee
Inventors
Key dates
| Filing date | Jul 20, 2010 |
| Grant date | Jan 7, 2014 |
| Priority date | — |
| Expiry date | Jul 20, 2030 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01S17/89
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In a method for optically scanning and measuring an object by a laser scanner by a procedure in which a emission light beam modulated with a target frequency is emitted by means of a light emitter, a reception light beam reflected or otherwise scattered in some way from an object in the surroundings of the laser scanner is received, with a measuring clock, as a multiplicity of samples by means of a light receiver and in each case at least the distance from the object is determined from the phase angles of the multiplicity of samples for a plurality of measuring points by means of a control and evaluation device, for determining the distances, a phase shift caused by a distance difference of temporal adjacent samples is corrected in order to correct the distances.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.