Data storage device tester
US8626463B2 · kind B2 · utility
135Cited by
20References
50Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 29, 2010 |
| Grant date | Jan 7, 2014 |
| Priority date | — |
| Expiry date | Sep 8, 2031 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/56
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A data storage device (DSD) tester is disclosed for testing a DSD. The DSD tester comprises control circuitry operable to receive production line data through an interface, wherein the production line data is related to the DSD. The control circuitry executes a DSD test on the DSD, and transmits failure data generated by the DSD test and the production line data to a failure information database.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.