Integrated circuit testing with clock manipulation and auto-step features
US8627155B1 · kind B1 · utility
0Cited by
3References
18Claims
0Family size
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Key dates
| Filing date | Mar 3, 2011 |
| Grant date | Jan 7, 2014 |
| Priority date | — |
| Expiry date | Jan 26, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/24
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus having corresponding methods and non-transitory computer-readable media comprise: a function module to operate according to a clock signal; a clock manipulation module to manipulate an edge of the clock signal responsive to occurrence of a predetermined condition; and a report module to indicate a clock cycle number of the edge of the clock signal responsive to occurrence of an error in the function module.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.