Central processing unit test system
US8629680B2 · kind B2 · utility
Assignees
Inventors
Key dates
| Filing date | Sep 22, 2011 |
| Grant date | Jan 14, 2014 |
| Priority date | — |
| Expiry date | Aug 29, 2032 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06F11/24
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A central processing unit (CPU) test system includes a CPU socket, a CPU core controller, and a CPU test device. The CPU core controller stores a start voltage message. The CPU test device includes a voltage detection pin, an analog to digital (A/D) converter, and a microcontroller. The voltage detection pin detects a voltage of an electronic device connected to the CPU socket. The A/D converter converts the detected voltage into a digital signal. The microcontroller controls the CPU core controller to output the start voltage to the CPU socket according to the digital signal. The microcontroller stores a predetermined start voltage message. The microcontroller reads the start voltage message after controlling the CPU core controller to output the start voltage, and determines whether the CPU core controller supplies the start voltage to the CPU socket by comparing the read start voltage message with the predetermined start voltage message.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.